Tor Olav Kristensen wrote:
> 
> Strange. If so, I wonder how it is applied.

You project a stripe pattern onto an object. You take
a CCD-Image of this pattern. Then you "stress" the object
(put pressure in/onto it or whatever), project the same
pattern on it and take another picture. You overlay
those picture and you get a moiree pattern that you can
analyse.

Also useful in Speckle interferometry.

(http://www.google.com) and search for speckle interferometry
and/or moiree analysis.

Markus

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