In article <3e157f92$1@news.povray.org>,
 "Thorsten Froehlich" <tho### [at] trfde> wrote:

> Keep in mind that such a method will very likely require more samples to be
> taken. 

Probably...but it looks like many artifacts are due to low sample 
density in the "low" areas: a couple near-tangent samples hit a bright 
source, but no others do. At that point, you could already have enough 
near-perpendicular samples for a good approximation, but increasing 
samples mainly adds more there. It might be worth it to add some kind of 
switch. Maybe combine the two...the even distribution method would 
probably be slower, because it has to weight the samples. You could use 
some samples on the variable distribution, and use any left over on the 
even distribution to fill in any gaps, keeping some benefit from each.

-- 
Christopher James Huff <cja### [at] earthlinknet>
http://home.earthlink.net/~cjameshuff/
POV-Ray TAG: chr### [at] tagpovrayorg
http://tag.povray.org/

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