> I'm doing Simulation of Synthetic Aperture Radar( SAR )Mode/(Microwave Imaging).
>
> I came to through POV in one of the IEEE research paper and I thought it would
> be useful for me. There is one segment in my project is scene object
> reflectivity pattern calculation say the object can be building or car or tree
> etc...
>
> How to calculate the reflectivity pattern using any of the Electromagnetic
> Imaging Algorithm like Ray Tracing Method / Physical Optics(PO) Method. I
> suppose that POV can help me on that. It would be very helpful, if i get any
> sort of suggestion from this group. At least let me know if my understanding is
> correct or not ?
>
> Thanks
>
>

You can not simulate any interference pattern from several sources or 
reflective objects. The best you can get is thin film irisation. A very 
narow slit can't show anything but a sharp pattern. Those are crutial 
for any SAR.

For the visible spectrum, you can add some reflection in the finish of 
your objects. Metals have prety uniform reflectivity, but other 
materials normaly have variable reflection.

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